diffusion of nitrogen in plasma nitrided iron and structural evolution during the nitriding process were evaluated by several characterization techniques including optical microscopy (om), microhardness depth profiling (hdp), scanning electron microscopy (sem), x-ray diffraction (xrd), glow discharge optical emission spectroscopy (gdoes), and secondary ion mass spectroscopy (sims). plasma nitri...

The analytical steady-state statistical sputtering model (SS-SSM) is utilized to interpret molecular dynamics (MD) simulations of depth profiling of Ag solids with keV cluster beams of C(60) and Au(3) under different incident energy and angle conditions. Specifically, the results of the MD simulations provide the input to the SS-SSM and the result is a depth profile of a delta layer. It has bee...

This paper compares the performances of the binocular cues of stereo and vergence, and the monocular cue of focus for range estimation using an active vision system. The performance of each cue is characterized in terms of sensitivity to errors in the imaging parameters. The effects of random, quantizatiain errors are expressed in terms of the standard deviation of the resulting: depth error. T...

objective(s): the purpose of this study was to conduct a meta-analysis on human micrornas (mirnas) expression data of endometriosis tissue profiles versus those of normal controls and to identify novel putative diagnostic markers. materials andmethods: pubmed, embase, web of science, ovid medline were used to search for endometriosis mirna expression profiling studies of endometriosis. the mirn...

the earliest evidences on circulation of avian influenza (ai) virus on the iranian poultry farms date back to 1998. great economic losses through dramatic drop in egg production and high mortality rates are characteristically attributed to h9n2 ai virus. in the present work non-structural (ns) genes of 10 iranian h9n2 chicken ai viruses collected during 1998-2007 were fully sequenced and subjec...

Molecular depth profiling of organic thin films by erosion with energetic cluster ion beams is a unique aspect of secondary ion mass spectrometry (SIMS) experiments. Although depth profiles of complex multilayer organic structures can be acquired with little damage accumulation and with depth resolution of <10 nm using either C60(+) or Arx(+) with x = 500-5000, hybrid materials consisting of bo...