نتایج جستجو برای: diffraction imaging
تعداد نتایج: 515781 فیلتر نتایج به سال:
We propose a fluorescence surface imaging system that presents a power of resolution beyond that of the diffraction limit without resorting to saturation effects or probe scanning. This is achieved by depositing the sample on an optimized periodically nanostructured substrate in a standard total internal reflection fluorescence microscope. The grating generates a high-spatial-frequency light gr...
We designed, constructed, and tested a surface plasmon resonance (SPR) microscope using a high numerical aperture objective from a commercially available inverted optical microscope. Such a configuration, combined with various methods to shorten the surface plasmon propagation length, achieves diffraction-limited spatial resolution in the transverse direction and near-diffraction-limited resolu...
Blurred diffraction images acquired from flowing particles affect the measurement of fringe patterns and subsequent analysis. An imaging unit with one time-delay-integration (TDI) camera has been developed to acquire two cross-polarized diffraction images. It was shown that selected elements of Mueller matrix of single scatters can be imaged with pixel matching precision in this configuration. ...
Typically limited by the diffraction of light, most optical spectroscopy methods cannot provide the spatial resolution necessary to characterize specimens at the nanoscale. An emerging exception to this rule is tip-enhanced Raman spectroscopy (TERS), which overcomes the diffraction limit through electromagnetic field localization at the end of a sharp metallic tip. As demonstrated by the Zenobi...
The diffraction limit of light, which is causd by the loss of evanescent waves in the far field that carry high spatial frequency information, limits the resolution of optical lenses to the order of the wavelength of light. We report experimental demonstration of the optical hyperlens for sub-diffraction-limited imaging in the far field. The device magnifies subwavelength objects by transformin...
A new electron diffraction microscope based on a conventional scanning electron microscope (SEM), for obtaining atomic-level resolution images without causing serious damage to the specimen, has been developed. This microscope in the relatively low-voltage region makes it possible to observe specimens at suitable resolution and record diffraction patterns. Using the microscope we accomplished 1...
We present a digital method for holographic microscopy involving a CCD camera as a recording device. Off-axis holograms recorded with a magnified image of microscopic objects are numerically reconstructed in amplitude and phase by calculation of scalar diffraction in the Fresnel approximation. For phase-contrast imaging the reconstruction method involves the computation of a digital replica of ...
Real time, in situ, multiframe, diffraction, and imaging measurements on bulk samples under high and ultrahigh strain-rate loading are highly desirable for micro- and mesoscale sciences. We present an experimental demonstration of multiframe transient x-ray diffraction (TXD) along with simultaneous imaging under high strain-rate loading at the Advanced Photon Source beamline 32ID. The feasibili...
Recent theory has predicted a superlens that is capable of producing sub-diffraction-limited images. This superlens would allow the recovery of evanescent waves in an image via the excitation of surface plasmons. Using silver as a natural optical superlens, we demonstrated sub-diffraction-limited imaging with 60-nanometer half-pitch resolution, or one-sixth of the illumination wavelength. By pr...
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by pl...
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