نتایج جستجو برای: four point probe
تعداد نتایج: 1194135 فیلتر نتایج به سال:
Current characterization methods of the temperature coefficient resistance (TCR) thin films are often limited to slow macroscale measurements, which further require a direct determination temperature. In this work, we present an innovative application micro four-point probe (M4PP) sensing, enables fast, non-destructive, local measurement Joule heating effects that can be translated into TCR fil...
در این رساله خواص ساختاری، اپتیکی و الکتریکی لایه های نازک کربن مس مورد بررسی قرار گرفته است. لایه های نازک کربن مس بر روی زیر لایه شیشه تهیه شدند. این لایه ها به دو روش کندوپاش مغناطیسی rf و dc در زمانهای مختلف در دمای اتاق لایه نشانی شدند. سپس با استفاده از میکروسکوپ نیروی اتمی afm))، edx، میکروسکوپ روبشی (sem)، طیف پراش اشعه ایکس(xrd)، طیف سنج ft-ir و جذب نوری uv_vis مورد مطالعه و بررسی قرار...
Structural, Optical and Electrical Properties of SilverNanoparticlesDeposited by Spin Coating Method
In this study, silver nanoparticles were synthesized by chemical reduction method at different concentrations of Ag colloid in the range of 500-16000 ppm. Nanoparticles were deposited by spin coating method on pre-etched glass and Si substrates. Structural, optical and electrical properties of the samples were studied using Scanning Electron Microscopy equipped with EDAX, UV-Vis spectroph...
structural, optical and electrical properties of silvernanoparticlesdeposited by spin coating method
in this study, silver nanoparticles were synthesized by chemical reduction method at different concentrations of ag colloid in the range of 500-16000 ppm. nanoparticles were deposited by spin coating method on pre-etched glass and si substrates. structural, optical and electrical properties of the samples were studied using scanning electron microscopy equipped with edax, uv-vis spectrophotomet...
By the use of twoand four-point probe measurements, much can be learned about the characteristics of a doped silicon wafer. The two-point probe system (spreading resistance probe) will provide resistivity vs depth profiles while the four-point probe system will indicate the uniformity of the diffusion over the surface of the wafer. Both systems have the same equation as their basis. The develop...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید