نتایج جستجو برای: four point probe

تعداد نتایج: 1194135  

Journal: :Journal of Applied Physics 2021

Current characterization methods of the temperature coefficient resistance (TCR) thin films are often limited to slow macroscale measurements, which further require a direct determination temperature. In this work, we present an innovative application micro four-point probe (M4PP) sensing, enables fast, non-destructive, local measurement Joule heating effects that can be translated into TCR fil...

پایان نامه :دانشگاه آزاد اسلامی - دانشگاه آزاد اسلامی واحد تهران مرکزی - دانشکده فیزیک 1391

در این رساله خواص ساختاری، اپتیکی و الکتریکی لایه های نازک کربن مس مورد بررسی قرار گرفته است. لایه های نازک کربن مس بر روی زیر لایه شیشه تهیه شدند. این لایه ها به دو روش کندوپاش مغناطیسی rf و dc در زمانهای مختلف در دمای اتاق لایه نشانی شدند. سپس با استفاده از میکروسکوپ نیروی اتمی afm))، edx، میکروسکوپ روبشی (sem)، طیف پراش اشعه ایکس(xrd)، طیف سنج ft-ir و جذب نوری uv_vis مورد مطالعه و بررسی قرار...

Journal: :The Transactions of The Korean Institute of Electrical Engineers 2011

S. A. Hashemizadeh S. Darvishi, S. M. Borghei

In this study, silver nanoparticles were synthesized by chemical reduction method at different concentrations of Ag colloid in the range of 500-16000 ppm. Nanoparticles were deposited by spin coating method on pre-etched glass and Si substrates. Structural, optical and electrical properties of the samples were studied using Scanning Electron Microscopy equipped with EDAX, UV-Vis spectroph...

Journal: :journal of nanostructures 2012
s. darvishi s. m. borghei s. a. hashemizadeh

in this study, silver nanoparticles were synthesized by chemical reduction method at different concentrations of ag colloid in the range of 500-16000 ppm. nanoparticles were deposited by spin coating method on pre-etched glass and si substrates. structural, optical and electrical properties of the samples were studied using scanning electron microscopy equipped with edax, uv-vis spectrophotomet...

2002
Roger Brennan David Dickey

By the use of twoand four-point probe measurements, much can be learned about the characteristics of a doped silicon wafer. The two-point probe system (spreading resistance probe) will provide resistivity vs depth profiles while the four-point probe system will indicate the uniformity of the diffusion over the surface of the wafer. Both systems have the same equation as their basis. The develop...

Journal: :Kathmandu University Journal of Science, Engineering and Technology 2013

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید