A yield enhanced layout method for maximizing yield of integrated resistor networks with a fixed total area is discussed. This approach incorporates both random variations in the sheet resistance and random variations in the contact resistances. The concept of contact/sheet resistance crossover which gives the crossover between contact-resistance dominance and sheet resistance dominance is deve...

Contact resistances of bonded copper interconnects in threedimensional integration technology under different bonding conditions are investigated by using a novel test structure. A reduction in specific contact resistance is obtained by longer anneal time. The specific contact resistance of bonded interconnects with longer anneal time does not change with the interconnect sizes. Underlying phys...

To realize nanocarbons in general and carbon nanotube (CNT) in particular as on-chip interconnect materials, the contact resistance stemming from the metal–CNT interface must be well understood and minimized. Understanding the complex mechanisms at the interface can lead to effective contact resistance reduction. In this study, we compile existing published results and understanding for two met...

This comment is on the paper ‘‘Piezoresistive Effect in SiOC Ceramics for Integrated Pressure Sensors’’, by Riedel et al. The experimental method of testing the piezoresistive behavior is flawed in this paper, as explained below. A similar flaw exists in Zhang et al. which is referenced by the subject paper. Due to this flaw, the piezoresistive results are not reliable. Piezoresistivity refers ...

The present study aimed to evaluate the antibiotic resistance pattern of Escherichia coli strains isolatedfrom animals to ascertain the levels of antibiotic resistance pervasiveness. A total of 28 E. coli strains wereisolated from faecal samples and the antibiotic resistance pattern of E. coli strains was determined by meansof disc diffusion assay. The resistance pattern determined for all stra...