The analysis of electron micrographs by optical diffraction was introduced recently by Klug & Berger (1964). Their experiments were conducted with a special diffractometer designed for use with diffracting masks up to several inches in diameter. A method is described here for using a conventional light microscope as an optical diffractometer which can accept masks up to 5 mm in diameter. A 100-...

Two data sets were collected on single crystals of hexamethylenetetramine (urotropin) using a fourcircle diffractometer with Cu K~ radiation and an imaging-plate two-dimensional detector with Mo K~ source using the rotation method. Both data sets extend to the same limit of sin 0/2 = 0.62A -~, corresponding to a resolution of 0.81 ,&. Different processing protocols were employed for the two set...

We have instrumented the 5ID-C hutch of DND-CAT at the Advanced Photon Source (APS) for x-ray surface spectroscopy and scattering. A wide variety of experiments have already been carried out at 5ID-C, including studies on semiconductors, oxides, metals, nanodots, and biomolecular adsorption. We describe the beamline optics, data collection hardware and software, and both diffractometers, a five...

At PTB different laser scatterometers with partly novel and outstanding metrological capabilities have been developed and are available for high-resolution dimensional metrology of periodic nanostructures. Two different systems are described and their metrological potential discussed: a laser diffractometer for pitch calibration and a versatile goniometric scatterometer for multi-parameter char...