We present Generalized Diffractometer Control (GDC), a diffractometer-control software package developed specifically for high-precision measurements of Bragg rods; we discuss its features and analyze its performance in data collection. GDC, implemented at several APS beamlines, controls a six-circle diffractometer in either Eulerian or kappa geometry, yet does not assume a mechanically ideal d...

A new diffractometer that can be described as a high-intensity low-background high-resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is less obvious. The sample requires minimal sample alignment, the resolution can be adjusted to optim...

A new single-crystal neutron diffractometer based on a large-area curved two-dimensional position-sensitive detector (C-2DPSD) has been developed. The diffractometer commissioning is almost complete, together with development of the measurement methodology and the raw data processing software package, the Reciprocal Analyzer, and the instrument is now ready to be launched for users. Position de...

A new powder diffractometer operating in transmission mode is described. It can work as a rapid very compact instrument or as a high-resolution instrument, and the sample preparation is simplified. The incident beam optics create pure Cu Kα1 radiation, giving rise to peak widths of ∼0.1° in 2θ in compact form with a sample-to-detector minimum radius of 55 mm, reducing to peak widths of <0.05° i...

Innovative applications of the Rietveld method [1-3] are likely to include new developments in microstructure analysis. More and more samples show microstructure effects on line profile shape, width and position. Reasons are obviously the powder diffractometer resolution improvements at leading synchrotron sources, and the increasing user number. When the minimal full width at half maximum is a...

The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are determined by the diffractometer configuration. In a divergent beam diffractometer these include ...

I N T R O D U C T I O N Optical diffraction and filtering of electron micrographs offers an objective method for analysing periodic structures. Because the preservation of detail in electron micrographs usually is not perfect, many micrographs must be examined and assessed to identify images suitable for analysis. I t is useful to have an instrument that allows one to survey many dozens of elec...