Accelerator mass spectrometry measures the depth profiles of material concentration in solid samples. Crater edge effects affect the experimental data when the secondary ions are sputtered from the sidewalls of the produced crater. We present a simple mathematical unfolding procedure that removes the perturbing contribution from the measured depth profile data. Application of this procedure to ...

A new absorption constrained profile fitting method has been developed for use in depth profile analysis of residual stress using x-ray diffraction data at a series of fixed incidence angles. By explicitly accounting for absorption of x-rays during the peak fitting process this method establishes a direct association between a chosen layer depth and resulting fit data. While peak positions are ...

Langmuir-Blodgett multilayers of alternating barium arachidate and barium dimyristoyl phosphatidate are characterized by secondary ion mass spectrometry employing a 40 keV buckminsterfullerene (C60) ion source. These films exhibit well-defined structures with minimal chemical mixing between layers, making them an intriguing platform to study fundamental issues associated with molecular depth pr...

We report on development of an optical-thermal model to evaluate the use of pulsed photothermal radiometry (PPTR) for depth profiling of port wine stain (PWS) skin. In the model, digitized histology sections of a PWS biopsy were used as the input skin geometry. Laser induced temperature profiles were reconstructed from simulated PPTR signals by applying an iterative, non-negatively constrained ...