نتایج جستجو برای: semiconductor device testing
تعداد نتایج: 1029873 فیلتر نتایج به سال:
Semiconductors with a moderate bandgap have enabled modern electronic device technology, and the current scaling trends down to nanometer scale have introduced two-dimensional (2D) semiconductors. The bandgap of a semiconductor has been an intrinsic property independent of the environments and determined fundamental semiconductor device characteristics. In contrast to bulk semiconductors, we de...
In this paper we present a state-of-theart report on mathematical and numerical steady state semiconductor device modeling. As underlying device model we use the basic semiconductor device equations, which consist of Poisson's equation, the current relations and the continuity equations. By appropriate scaling we reformulate the device problem as singularly perturbed elliptic system with the ch...
ment in electronic systems has, in large part, the advances in Very Large Scale of Integration (VLSI) semiconductor technologies to thank. Performance, area, power and testing are some of the most important improvements. With the reduction in device sizes, it is becoming possible to fit increasingly larger number of transistors onto a single chip. However, as chip density increases, the probabi...
Self-assembly (‘building’) approaches can provide well-controlled structures and assemblies at the nanometer scale, but typically do not provide the specific structures or functionalities required for robust nanoelectronic circuits. One approach to realize high-density nanoelectronic circuits is to combine self-assembly techniques with more conventional semiconductor device and circuit approach...
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