نتایج جستجو برای: semiconductor process modelling

تعداد نتایج: 1498214  

Journal: :IEEE Transactions on Semiconductor Manufacturing 2023

Multivariate batch time-series data sets within Semiconductor manufacturing processes present a difficult environment for effective Anomaly Detection (AD). The challenge is amplified by the limited availability of ground truth labelled data. In scenarios where AD possible, black box modelling approaches constrain model interpretability. These challenges obstruct widespread adoption Deep Learnin...

2016
P Beckstein V Galindo G Gerbeth A Schönecker V. Galindo G. Gerbeth A. Schönecker

The cost efficient, high throughput production of metaland semiconductor alloys is the foundation of many advanced technologies. With the development of the Ribbon Growth on Substrate (RGS) technology, a new crystallization technique is available that allows the controlled, high crystallization rate production of silicon wafers and advanced metal-silicide alloys. Compared to other crystallizati...

Journal: :Journal of The Japan Institute of Electronics Packaging 2018

Journal: :Journal of the Japan Society of Precision Engineering 1985

Journal: :Journal of Engineering Research and Reports 2020

Journal: :Journal of the Environmental Sciences international 2013

Journal: :The Review of Laser Engineering 1984

Journal: :IOP Conference Series: Materials Science and Engineering 2019

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