Control Chart Patterns (CCPs) recognition is one the most important concepts in control chart application. Relating the patterns exhibited on the control chart to assignable causes is an ambiguous and vague task especially when multiple patterns co-exist. In this study, a fuzzy rule-based system is developed for X ̅ control charts to prioritize the control chart causes based on the accumulated e...

As a common approach in the development of control charts Statistical Process Control (SPC), an industrial process is monitored with one or more quality characteristics using their corresponding distributions. Note though, modelling through relation between some independent and dependent variables alternative which designated as profiles monitoring. This study proposes integration adaptive to c...

The psychrometric chart is the most common data visualization technique for designers of thermal comfort systems worldwide. From its humble roots as means expressing characteristics air in building design, use has grown to include representation zones human according both conventional and adaptive models. In this paper, we present an extensive history development fallacies with representing sim...

Identification of the assignable causes of process variability and the restriction and elimination of their influence are the main goals of statistical process control (SPC). Identification of these causes is associated with so called tests for special causes or runs tests. From the time of the formulation of the first set of such rules (Western Electric rules) several different...

Control chart is the most well-known chart to monitor the number of nonconformities per inspection unit where each sample consists of constant size. Generally, the design of a control chart requires determination of sample size, sampling interval, and control limits width. Optimally selecting these parameters depends on several process parameters, which have been considered from statistical and...

The primary aim of this research is to propose a revised triple sampling (TS) X¯ chart, where the derivations new formulae for computing average run length chart correctly are provided. secondary develop TS with estimated process parameters. charts compared double (DS) X¯, two stage adaptive sample size (AS2) and three (AS3) when parameters known using (ARL), number observations signal (ANOS), ...

CCC-r chart extended approach of CCC charts, is a technique applied when nonconforming items are rarely observed. However, it is usually assumed that the inspection process is perfect in the implementation control charts imperfect inspections may have a significant impact on the performance of the control chart and setting the control limits. This paper first investigates the ...