نتایج جستجو برای: called control run

تعداد نتایج: 1694080  

Journal: :Computers & Chemical Engineering 2021

Facilitated by the increasing importance and demand of semiconductors for smartphone even automobile industry, plasma-enhanced atomic layer deposition (PEALD) has gained tremendous industrial interest as it offers a way to efficiently deposit thin-films with ultra-high conformity. A series studies have been carried out elucidate mechanisms concept PEALD process. Despite great deal research effo...

Journal: :Chemical engineering research & design 2022

With the growing scarcity of semiconducting devices stemming from volatile prices, shortened supplies, and increased demand that are attributed to Covid-19 pandemic, manufacturers looking for efficient ways facilitate production nanoscale devices. Thermal atomic layer etching (ALE) is a promising method can overcome obstacles encountered during via conventional approaches by delivering precise ...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تربیت دبیر شهید رجایی - دانشکده علوم انسانی 1392

abstract due to the growing importance and influence of the self of the teacher in the field of educational and cognitive psychology, the current study intended to investigate the relationship between three teacher qualities and characteristics, i.e. teacher self efficacy, self regulation, and success as perceived by their learners. the study aimed at finding whether teacher self efficacy an...

Journal: :iranian journal of science and technology (sciences) 2014
m. riaz

in statistical quality control a very widely used measure is average run length (arl) which may be worked out by different methods like integral equation, approximations, and monte carlo simulations. the arl measure and the other related measures are of major significance in every type of production process. an omission in its computation (and hence its related measures such as extra quadratic ...

Journal: :international journal of industrial engineering and productional research- 0
abbas saghaei science and research branch, islamic azad university maryam rezazadeh-saghaei parsian quality and productivity research center rasoul noorossana iran university of science and technology mehdi doori islamic azad university-south tehran branch

in many industrial and non-industrial applications the quality of a process or product is characterized by a relationship between a response variable and one or more explanatory variables. this relationship is referred to as profile. in the past decade, profile monitoring has been extensively studied under the normal response variable, but it has paid a little attention to the profile with the ...

2002
Bernhard Klaassen Hermann Streich Frank Kirchner

The combined modeling and control task for a multi-joint sewer inspection system is described. The robot, called MAKRO1.1 is of worm-like shape and designed for pipes of 30 to 60 cm width. Since the control of more than 20 degrees of freedom is not a simple task, we need simulation of the robots kinematics before and during every run. In this case, our simulation of the robot’s motions is fast ...

Journal: :e-Informatica 2011
Zbigniew Hajduk Jan Sadolewski Bartosz Trybus

An FPGA-based execution platform for PLC controllers with capability to run multiple control tasks is presented. The platform, called multi-CPCore, uses hardware virtual machines to execute control tasks defined in CPDev engineering environment. The tasks consist of one or more programs written in IEC 61131-3 languages, such as ST, IL or FBD. They may run with different cycles and communicate v...

Journal: :Comput. J. 2006
Cinzia Bernardeschi Giuseppe Lettieri Luca Martini Paolo Masci

Java applets run on a Virtual Machine that checks code integrity and correctness before execution using a module called the Bytecode Verifier. Java Card technology allows Java applets to run on smart cards. The large memory requirements of the verification process do not allow the implementation of an embedded Bytecode Verifier in the Java Card Virtual Machine. To address this problem, we propo...

Journal: :International Journal of Quality & Reliability Management 1994

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