نتایج جستجو برای: ray diffraction xrd analysis showed that mg
تعداد نتایج: 8143623 فیلتر نتایج به سال:
Indium tin oxide (ITO) and titanium dioxide (TiO2) anti-reflective coatings (ARCs) were deposited on a (100) P-type monocrystalline Si substrate by a radio-frequency (RF) magnetron sputtering. Polycrystalline ITO and anatase TiO2 films were obtained at room temperature (RT). The thickness of ITO (60 to 64 nm) and TiO2 (55 to 60 nm) films was optimized, considering the optical response in the 40...
Iron oxide-silica nanoparticles (IOSi-NPs) were prepared from a mixture of ferrous chloride tetrahydrate and ferric chloride hexahydrate dropped into a silica xerogel composite. The structure and morphology of the synthesized maghemite nanoparticles into the silica xerogel were analysed by X-ray diffraction measurements, scanning electron microscopy equipped with an energy dispersive X-ray spec...
The influence of conventional and accumulative HPT (Acc. HPT) process on structural properties Zr62Cu22Al10Fe5Dy1 metallic glass (MG) phase is examined by X-ray diffraction (XRD) technique. XRD results showed that leads to free volume generation in MG. Free increases with the number anvil turns process, while highest increment was observed Acc. process. To understand role latent crystalline pha...
In this work, Mg-doped ZnO nanostructures were prepared in water under ultrasonic irradiation for 60 min without using any organic compounds or post preparation treatments. The prepared samples were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive analysis of X-ray (EDX), diffuse reflectance spectroscopy (DRS...
The interlamellar spacing of layered double hydroxides (LDHs) was enlarged by dodecyl sulfonate ions firstly, and then, (3-aminopropyl)triethoxysilane (APS) was chemically grafted (APS/LDHs). The structural characteristics and thermal stability of these prepared samples were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), reflectance Fourier transform infrared ...
in this research, tio2 nanoparticles were synthesized by a simple wet chemical method. ticl4 was used as precursor in hydrogen peroxideand ethanol. the tio2 nanoparticles were characterized by transmission electron microscopy (tem), scanning electron microscopy (sem), x-ray diffraction (xrd), electron dispersive spectroscopy (eds) and uv-vis spectrophotometer. the particle size of the as-synthe...
Cadmium oxide (CdO) nanoparticles have been prepared by chemical coprecipitation method. The synthesized nanoparticles were characterized by X-ray diffraction analysis (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), UV analysis, and dielectric studies. The crystalline nature and particle size of the CdO nanoparticles were characterized by Powder X-ray diffract...
We analyze graphene and some of the carbon allotropes for which graphene sheets form the basis. The real-space and reciprocal crystalline structures are analyzed. Theoretical X-ray diffraction (XRD) patterns are obtained from this analysis and compared with experimental results. We show that staggered two-dimensional hexagonal lattices of graphite have XRD patterns that differ significantly fro...
Blown-powder laser surface alloying was performed on the magnesium alloy AZ91D with Al-Si alloy powder to improve corrosion resistance. Characterization by scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS) and x-ray diffraction (XRD) analysis revealed that intermetallic compounds (IMCs) of Mg2Si, Al12Mg17 and Al3Mg2 were formed in the matrix of α-Mg and Al solid solutions...
X-ray diffraction (XRD) analysis is a fundamental method to evaluate the carbon stacking structure in coal and carbon materials. However, the vagueness of XRD pattern of coal, which has the low crystallinity, often makes it difficult to evaluate the stacking structure quantitatively. In a previous study [1,2], we reported the standard analysis of carbon stacking structure in coal by XRD techniq...
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