− A march test of length 30n for detecting static 3-coupling faults in n × 1 random-access memories (RAMs) is presented. To reduce the length of the test, only the coupling faults between physically adjacent memory cells have been considered. The test assumes that the storage cells are arranged in a rectangular grid and that the mapping from logical addresses to physical cell locations is known...

This document describes the ARIA encryption algorithm. ARIA is a 128-bit block cipher with 128-, 192-, and 256-bit keys. The algorithm consists of a key scheduling part and data randomizing part. Status of This Memo This document is not an Internet Standards Track specification; it is published for informational purposes. This is a contribution to the RFC Series, independently of any other RFC ...

Embedded content addressable memories (CAMs) are important components in many system chips. In this paper two efficient March-like test algorithms are proposed. In addition to typical RAM faults, they also cover CAMspecific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N + W ) Compare operations to cover comparison and RAM faults (but does not fully cover the in...

Given a set of memory array faults the problem of computing a compact March test that detects all specified memory array faults is addressed. In this paper, we propose a novel approach in which every memory array fault is modeled by a set of primitive memory faults. A primitive March test is defined for each primitive memory fault. We show that March tests that detect the specified memory array...

Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing Static Random Access Memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technolog...

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Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing Static Random Access Memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technolog...