«semiconductor device testing»
۳۲۲۰ نتیجهMonte Carlo Algorithms for Stationary Device Simulation Abstract The Monte Carlo (MC) method for simulation of semi-classical transport in semiconductors
The Monte Carlo (MC) method for simulation of semi-classical transport in semiconductors evolved for more than three decades to meet the challenges in the research and development of new semiconductor devices. The main MC algorithms used to date were initially devised from merely
Defect Based Testing of Superconductor Electronics
Recent advances in computing and telecommunication technologies require ultra-highspeed and high-precision devices in the digital domain for their realization. The clock frequencies of semiconductor devices have increased beyond expectations, but will not be able to solve the abo
Optimized Power Semiconductors for the Power Electronics Based HVDC Breaker Application
In the field of power electronics applications, advances in high voltage semiconductor devices have led specifically over the past few decades to tremendous improvements in terms of power handling capability and control. We focus in this paper on the recent developments with rega
Optimized Power Semiconductors for the Power Electronics Based HVDC Breaker Application
In the field of power electronics applications, advances in high voltage semiconductor devices have led specifically over the past few decades to tremendous improvements in terms of power handling capability and control. We focus in this paper on the recent developments with rega
Heat-Transfer Enhancing Features for Handler Tray-Type Device Carriers
Many test handlers process semiconductor devices in trays which must be rapidly heated or cooled by a forced air flow to a desired test temperature and then back to ambient temperature. This paper describes a new design feature for testhandler tray that significantly increases th
Analysis and hardware testing of cell capacitor discharge currents during DC faults in half-bridge modular multilevel converters
This paper focuses on the behaviour of the cell capacitor discharge currents during DC faults in half-bridge modular multilevel converters. Active switches, not designed for fault conditions, are tripped to minimize discharge currents effect on the semiconductor switches. Two lev
Investigation of Bayesian Mixtures-of-Experts models to predict semiconductor lifetime
Investigating the reliability of a semiconductor device is time and cost consuming, but essential for industry and customers. To save resources, models that predict the lifetime and the valid parameter range dependent on the stress conditions are needed. The given semiconductor l
Monotone Iterative Method for Parallel Numerical Solution of 3D Semiconductor Poisson Equation
Various self-consistent semiconductor device equations, such as drift diffusion, hydrodynamic and Boltzmann transport equations require solution of a multi-dimensional Poisson’s equation that describes the potential distribution in the device for a specified doping profile. In th
Fabrication and Device Simulation of Single Nano-Scale Organic Static Induction Transistors
A well-defined test structure of organic static-induction transistor (SIT) having regularly sized nano-apertures in the gate electrode has been fabricated by colloidal lithography using 130-nm-diameter polystyrene spheres as shadow masks during vacuum deposition. Transistor chara
Single-Electron Transistor (SET) Process and Device Simulation Using SYSNOPSYS TCAD Tools
Simulation of semiconductor device fabrication and operation is important to the design and manufacture of integrated circuits because it provides insights into complex phenomena that cannot obtained through experimentation or simple analytic models. Process and device simulation