نتایج جستجو برای: semiconductor device testing
تعداد نتایج: 1029873 فیلتر نتایج به سال:
We report electrical measurements of ' a sandwich structure consisting of a niobium electrode in contact with a thin lightly doped n type InGaAs layer. The bottom of the sandwich is a degenerate layer of n-type InGaAs used to collect the current. The semiconductor layers are grown by molecular beam epitaxy (MBB). These three layers are the essence of the proposed superconducting-base, semicondu...
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We have successfully designed the geometry of the microwave cavity and the thin metal electrode, achieving resonance of the microwave cavity with the metal-insulator-semiconductor (MIS) device structure. This very simple MIS device operates in the cavity, where charge carriers are injected quantitatively by an applied bias at the insulator-semiconductor interface. The local motion of the charge...
Multilevel inverters are a source of high power, often used in medium-voltage application. Multilevel converters have received increased interest recently due to high quality output waveform and decrease the harmonic distortion in the output waveform without decreasing the inverter power output. A multilevel inverter uses a series of semiconductor power converters, thus generating higher voltag...
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