Citation: Hedley JD, Russell BJ, Randolph K, Pérez-Castro MÁ, Vásquez-Elizondo RM, Enríquez S and Dierssen HM (2017) Remote Sensing of Seagrass Leaf Area Index and Species: The Capability of a Model Inversion Method Assessed by Sensitivity Analysis and Hyperspectral Data of Florida Bay. Front. Mar. Sci. 4:362. doi: 10.3389/fmars.2017.00362 Remote Sensing of Seagrass Leaf Area Index and Species:...

The production of a process is expected to meet customer demands, specifications or engineering tolerances. The ability of a process to meet these expectations is expresed as a single number using a process capability index. When the quality of the products relates to more than one characteristic, multivariate process capability indices are applied. As it is known, in some circumstances we are ...

Process capability indices PCIs aim to quantify the capability of a process of quality characteristic X tomeet some specifications that are related to ameasurable characteristic of its produced items. One such quality characteristic is life time of items. The specifications are determined through the lower specification limit L , the upper specification limit U , and the target value T . Maiti ...

various indexes such as rvi, ndvi, savi and osavi have been proposed for vegetation detection using satellite images. these indexes have been obtained based on high reflectance of the vegetation in near infrared band and its high absorption in red band. basic defect of these indexes are using them in various regions without any changes in index structure. in other words, these indexes have not ...

A manufacturing process cannot be released to production until it has been proven to be stable. Also, we cannot begin to talk about process capability until we have demonstrated stability in our process. This means that the process variation is the result of random causes only and all assignable or special causes have been removed. In complicated manufacturing processes, such as drilling proces...

Porous Silicon (PS) samples have been prepared by electrochemical anodization of p-type silicon wafer by varying HF concentrations in the electrolytic solution. The structural, surface morphological, optical and surface composition analysis of the prepared samples were done by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Photoluminescence (PL) and Fourier transform infr...