This paper presents an analytical model based on mean value analysis (MVA) technique for a probabilistic re-entrant line. The objective is to develop a solution method to determine the total cycle time of a Reflow Screening (RS) operation in a semiconductor assembly plant. The uniqueness of this operation is that it has to be borrowed from another department in order to perform the production s...

This paper presents a model and analysis of a reentrant production line with finite buffers and unreliable machines. Semiconductor device and liquid crystal display (LCD) fabrication processes are characterized as a re-entrant process, in which a similar sequence of processing step is repeated several times. The purpose of this paper is to present mathematical formulations and algorithms to ana...

Environmental stress testing (EST) is a reliability test for the semiconductor products that is concerned with how products perform its intended functions under some environmental conditions. Planning, implementation and delivery schedules are affected by the outcome of these tests and it is crucial to determine the throughput of the EST process. In this paper we present an efficient modified a...

We propose an approximate approach for estimating the performance measures of the re-entrant line with single-jobmachines and batch machines based on the mean value analysis (MVA) technique.Multi-class jobs are assumed to be processed in predetermined routings, in which some processes may utilize the same machines in the re-entrant fashion. The performance measures of interest are the steady-st...

This paper presents an analytical model based on mean value analysis (MVA) technique for a probabilistic re-entrant line. The objective is to develop a solution method to determine the total cycle time of a Reflow Screening (RS) operation in a semiconductor assembly plant. The uniqueness of this operation is that it has to be borrowed from another department in order to perform the production s...

In this paper we provide a probabilistic interpretat ion for typed feature structures very similar to those used by Pollard and Sag. We begin with a version of the interpretation which lacks a t rea tment of re-entrant feature structures, then provide an extended interpretat ion which allows them. We sketch algori thms allowing the numerical parameters of our probabilistic interpretations of HP...

High-volume, multistage continuous production flow through a re-entrant factory is modeled through a conservation law for a continuous-density variable on a continuous-production line augmented by a state equation for the speed of the production along the production line. The resulting nonlinear, nonlocal hyperbolic conservation law allows fast and accurate simulations. Little’s law is built in...

There is a close interrelationship between atrial fibrillation (AF) and atrial flutter (AFL). Atrial fibrillation of variable duration precedes the onset of AFL in almost all instances; during AF, the functional components needed to complete the AFL re-entrant circuit, principally a line of block (LoB) between the vena cavae, are formed; if this LoB does not form, classical AFL does not develop...

The basic partial differential equation PDE models for supply chain networks with re-entrant nodes and their macroscopic are proposed. However, through numerical examples, the basic continuummodels do not performwell for multiple re-entrant systems. Then, a new state equation considering the re-entrant degree of the products is introduced to improve the effectiveness of the basic continuum mode...