نتایج جستجو برای: compression testing

تعداد نتایج: 424822  

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تربیت مدرس - دانشکده برق و کامپیوتر 1390

one of the most important goals for increasing recognition and treatment revenue is transmitting vital data to medical care team, more quickly. nowadays, use of new technologies for transmitting data will deploy more and more daily. in this article, for transmitting electrocardiogram, first we code the signal into a suite of codes, then we will use bluetooth technology to transmit data from off...

Journal: :مهندسی سازه 0
شهرام شریفی

this article deals with a tentative method of concrete compression and the measurement of compressional resistance. the subject of free fall for concrete compression has not received adeqaute attention so far. in this research, the compresional resistance of compressed concrete with free fall is compared with the compressed concrete by trembling bed. to do so, 176 cylinderical testing case with...

Journal: :international journal of civil engineering 0
a. soroush hafez avenue, tehran, iran r. jannatiaghdam hafez avenue, tehran, iran

this paper studies thoroughly and deeply the results of about one hundred triaxial compression tests on thirty types of rockfill materials. the materials are categorized in accordance with their particles shape (angular / rounded) and gradation characteristics. the main tool of the study is the hyperbolic model developed by duncan and chang. the focus of the study is on the variations of deform...

Journal: :Journal of Materials Science 2015

Journal: :IEEE Transactions on Image Processing 2002

2007
Edwin S. Hong

We examine the applicability of group testing to wavelet-based image compression. We first review some recent image compression techniques and explain the group testing framework. We then explain how group testing already has been applied in image compression. In particular, we show that group testing is a generalization of the zerotree coding technique, and that Hwang’s group testing algorithm...

2015
P. Sindhuja S. Ramkumar

Test compression has become a de-facto technique in VLSI testing. Test data volume is a serious concern for the semiconductor testing because it not only prolongs the testing time of the integrated circuits (Ics), but also raises the tester memory depth requirements and excessive capture power at-speed testing has also become a serious concern. So it is important to co-optimize test power and c...

Journal: :IOP Conference Series: Materials Science and Engineering 2020

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