A model is created for the number of integrated circuits that are good from each wafer on which they are fabricated. The goal is to separate the random or common cause loss from the systematic or special loss. The random loss from this type of process is modeled so that false alarms indicating systematic loss are less likely to occur and so that the structure of the systematic loss can be deter...

The ability to improve the yield of integrated circuits through layout modification has been recognized and several techniques for yield enhanced routing and compaction have been developed. The approach described in this paper is aimed to improve the random defect limited yield of the VLSI design. The goal is achieved by increasing the design tolerance to short (extra material) and open (missin...

This paper proposes a simple and unifying model to price the interest rate contingent claims in a complete market where trading can be made in continuous time. The underlying dynamics of the yield curve is modelled by a random string whose trajectory produces a random surface described by a Brownian sheet. Generalising Black-Scholes' PDE methodology, we derive the Kolmogorov eld equation which ...

Accurate predictions of crop yield are critical for developing effective agricultural and food policies at the regional and global scales. We evaluated a machine-learning method, Random Forests (RF), for its ability to predict crop yield responses to climate and biophysical variables at global and regional scales in wheat, maize, and potato in comparison with multiple linear regressions (MLR) s...

Using monthly test day records the genetic parameters of Iranian Holstein cattle in first lactation were studied. Data of 277400 test-day milk records from 65320 cows and 2210 sires were analyzed by an animal random regression model using restricted maximum likelihood methodology. The model included herd-test-date, interaction between year-season of calving, days in milk (linear and quadratic) ...