X-ray Topographic Investigation of Ferromagnetic Domain Structures with Closure Domain Configurations in Iron-silicon Single Crystals
چکیده
The domain structure of single-crystal (110) plates of 2.4 wt % silicon-iron was investigated under tensile stress parallel to [IT01 by means of the Kerr technique and of Lang's method of transmission X-ray topography. It was possible, by using both section and traverse topographs, to gain information about the lattice distorsions, and therefore the domain structure, within specimens about 0,l mm thick. In particular, some section topographs seem to provide images of internal 900 walls, and the fringe system which appears on traverse topographs can be interpreted as a set of equal-depth contours for internal walls.