The curve of mean critical flicker frequency as a function of illumination has been determined for the reaction of the sunfish Lepomis to flicker. It exhibits expected quantitative disagreements with the curve of mean critical illumination as a function of flicker frequency in the same organism. The form of the dependence of the variation of critical frequency of flicker upon illumination can b...

Traditional flicker detection methods accurately extract the amplitude envelope as the premise, the complexity of large amount of computation. This paper presents a new real-time detection of voltage flicker method, analysis method with recursive frequency carrier signal frequency; use of the adjacent three-point sampling data, the frequency carrier signal frequency, sampling frequency voltage ...

Voltage variation is one of lamps flickering main cause; thus evaluation of a disturbing light flicker is a part of voltage quality classification. The instrument for flicker level measurement by means of voltage variation analysis is named flickermeter and is specified in standard EN 610004-15. The flickermeter is a specialized analyzer modeling response of a chain consisting of reference 60W ...

Rhythmic visual stimulation ("flicker") is primarily used to "tag" processing of low-level visual and high-level cognitive phenomena. However, preliminary evidence suggests that flicker may also entrain endogenous brain oscillations, thereby modulating cognitive processes supported by those brain rhythms. Here we tested the interaction between 10 Hz flicker and endogenous alpha-band (∼10 Hz) os...

Abstract— This paper considers two important classification algorithms for to classify several power quality disturbances. Artificial Neural Network (ANN) and support vector machine (SVM). The last one is a novel algorithm that has shown good performance in general patterns classification. Nevertheless, Multilayer Perceptron Artificial Neural Network (MLPANN) is the most popular and most widely...

: Low-frequency flicker noise has been measured in a metal-semiconductor-metal (MSM) device made from a single strand of a single crystalline Si nanowire (diameter approximately 50 nm). Measurement was done with an alternating current (ac) excitation for the noise measurement superimposed with direct current (dc) bias that can be controlled independently. The observed noise has a spectral power...