Traditional multivariate control charts assume that measurement from manufacturing processes follows a multivariate normal distribution. However, this assumption may not hold or may be difficult to verify because not all the measurement from manufacturing processes are normal distributed in practice. This study develops a new multivariate control chart for monitoring the processes with non-norm...

Control chart is the most well-known chart to monitor the number of nonconformities per inspection unit where each sample consists of constant size. Generally, the design of a control chart requires determination of sample size, sampling interval, and control limits width. Optimally selecting these parameters depends on several process parameters, which have been considered from statistical and...

The cumulative sum (CUSUM) control chart is widely used in industry for the detection of small and moderate shifts in process location and dispersion. For efficient monitoring of process variability, we present several CUSUM control charts for monitoring changes in standard deviation of a normal process. The newly developed control charts based on well-structured sampling techniques - extreme r...

CCC-r chart extended approach of CCC charts, is a technique applied when nonconforming items are rarely observed. However, it is usually assumed that the inspection process is perfect in the implementation control charts imperfect inspections may have a significant impact on the performance of the control chart and setting the control limits. This paper first investigates the ...

Control charts have been widely recognized as important and critical tools in system monitoring for detection of abnormal behavior and quality improvement. In particular, multivariate control charts have been effectively used when a process involves a number of correlated process variables. Most existing multivariate control charts were developed using the assumption of normally distributed pro...

Generally, the traditional Shewhart p chart has been developed by for charting the binomial data. This chart has been developed using the normal approximation with condition as low defect level and the small to moderate sample size. In real applications, however, are away from these assumptions due to skewness in the exact distribution. In this paper, a modified Exponentially Weighted Moving Av...