نتایج جستجو برای: memory built in self
تعداد نتایج: 17124790 فیلتر نتایج به سال:
the purpose of this quantitative study was to investigate the relation between efl teachers’ self-efficacy beliefs and their success. moreover, the study was an analysis of the teacher age, gender and years of teaching experience, to examine the manner in which these factors relate to teacher self-efficacy as defined by bandura (1997) and teaching effectiveness as evaluated by their own student...
in recent years, there has been a growing interest among researchers to investigate the relationship betweenteacher self-efficacy and classroom behavior management, especially students misbehavior. therefore, this study aimed to comparatively investigate english and arabic teachers’ use of different behavior managementstrategies, their self-efficacy, and their success in an iranian context. th...
the primary goal of the current project was to examine the effect of three different treatments, namely, models with explicit instruction, models with implicit instruction, and models alone on differences between the three groups of subjects in the use of the elements of argument structures in terms of toulmins (2003) model (i.e., claim, data, counterargument claim, counterargument data, rebutt...
educational researchers have provided evidence that teachers’ emotional intelligence has strong effects on various aspects of teaching and learning. yet, in the field of teaching english to speakers of other languages (tesol), inquiry into teachers’ emotional intelligence is nearly limited. given its documented powerful impact on teaching practices and student learning, it is critical to pursue...
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisite testing process is analyzed using device-under-test (DUT) parameters (such as yield and average number of faults per DUT) as well as test process features (such as number of channels, coverage and touchdown time for...
We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is comprehensive, and does not require expensive external test equipment (ATE). We have successfully implemented this BIST approach for delay-fault testi...
In this paper, we present the description and evaluation of a novel physical design tool, BISRAMGEN, that can generate reconfigurable and fault-tolerant RAM modules. This tool, first proposed in [3], designs a redundant RAM array with accompanying built-in self-test (BIST) and built-in self-repair (BISR) logic that can switch out faulty rows and switch in spare rows. Built-in self-repair causes...
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