نتایج جستجو برای: spc process monitoring charts pmc failure modes
تعداد نتایج: 2000704 فیلتر نتایج به سال:
Shewhart charts are the main tools for statistical process control. They are used for detecting assignable causes which affect quality of process output. From them, X and MR charts are two univariate control charts for monitoring mean and variation of measurable quality characteristics. The main drawbacks of these charts are: weakness of X chart against non-normal distribution of process data,...
We present a model that integrates real-time process control charting with simulation modeling to illustrate the effects and benefits of SPC charts for quality improvement efforts. The integrated model is particularly significant in addressing transition issues arising from changes in the input material. A case study based on a medical manufacturing .industry process is used to illustrate the a...
In this article, we introduce a method for monitoring the Weibull shape parameter β with type II (failure) censored data. The control limits depend on the sample size, the number of censored observations, the target average run length, and the stable value of β. The method assumes that the scale parameter α is constant during each sampling period, which is true under rational subgrouping. The p...
Background and Aim: Monitoring and evaluation are basic components of any health program. Control charts show clearly the process performance trend longitudinally and help managers and staff to detect general and specific variations and evaluate the process performance correctly. This study was conducted to design and utilize control charts in the primary health care (PHC) system. Materials an...
in many statistical process control applications, the quality of a process is characterized by a profile. a profile is a function in terms of one or more explanatory variables. in profile monitoring, one is interested to monitor the performance of a process or product using this functional relationship. control charts for monitoring nonparametric profiles are useful when the relationship is too...
Statistical Process Control (SPC) is widely applied to monitor and improve highly integrated and automated manufacturing processes. Adopting proper SPC charts and corresponding detection mechanisms is crucial for a TFT-LCD manufacturing process. This study conducts an empirical study of highly complex TFT-LCD manufacturing processes to identify the most suitable SPC method. The TFT-LCD manufact...
Recently, statistical process control (SPC) methodologies have been developed to accommodate autocorrelated data. To construct control charts for stationary process data, the process variance needs to be estimated. For an independently identically distributed sequence of a random variable, the variance is usually estimated by the sample variance. For a weakly stationary process, different estim...
Institutionally acquired pressure ulcers are used as outcome indicators to assess the quality of pressure ulcer prevention programs. Determining whether quality improvement projects that aim to decrease the proportions of institutionally acquired pressure ulcers lead to real changes in clinical practice depends on the measurement method and statistical analysis used. To examine whether nosocomi...
Control charts are used to identify the presence of assignable cause of variation in the process. Non-parametric control chart is an emerging area of recent development in the theory of SPC. Its main advantage is that it does not require any knowledge about the underlying distribution of the variable. In this paper a non-parametric control chart for controlling variability has been developed. I...
Statistical process control (SPC) is a significant method to monitor processes and ensure quality. Control charts are the most important tools in SPC. As production parts become more complex, there need design using complex distributions. One of number nonconformities C-chart, which uses Poisson distribution as quality characteristic distribution. However, fit count data, equality mean variance...
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