a new method is developed for a fast identification of the stability situation of industrial processes. the proposed method includes two factor ratios of the control constants for the upper and lower control limits to process these constants. an indication ratio is then defined as the ratio of the maximum data range value to the difference between the maximum and average values for individual d...

c-Chart was frequently used to monitor wafer defects during IC manufacturing. The clustering degree of defect on a wafer will increase along with the area of wafer gradually enlarging. The defect clustering causes the Poisson-based c-chart to exhibit many false alarms. Although several revised control charts have been developed to reduce the number of false alarms, those control charts still ha...

a manufacturing process cannot be released to production until it has been proven to be stable. also, we cannot begin to talk about process capability until we have demonstrated stability in our process. this means that the process variation is the result of random causes only and all assignable or special causes have been removed. in complicated manufacturing processes, such as drilling proces...

The cumulative count of a conforming (CCC) control chart is used for high quality processes.The CCC − r chart is an improvement of the CCC chart that is based on the cumulative number of items inspected until observing r non-conforming ones. This paper aims to propose a new approach for manufacturer’s decision making according to the criteria among the available options. The o...