In this paper, the Shiryaev-Roberts (SR) procedure is examined and compared with the change point CUSUM (CPC) procedure for monitoring the dispersion of a normal process. It will be shown that the SR chart performs better than the CPC chart for the pre-specified dispersion shift. In practice, when the magnitude of a future dispersion shift is unknown, it is always desired to design a control ch...

an asymptotically stable direct adaptive fuzzy pi sliding modecontroller is proposed for a class of nonlinear uncertain systems. in contrast toother existing approaches of handling disturbances, the proposed approachdoes not require this bound to be known, only requiring that it exists.moreover, a pi control structure is used to attenuate chattering. the approachis applied to stabilize an open-...

in this paper, we introduce a new hyperchaotic complex t-system. this system has complex nonlinear behavior which we study its dynamical properties including invariance, equilibria and their stability, lyapunov exponents, bifurcation, chaotic behavior and chaotic attractors as well as necessary conditions for this system to generate chaos. we discuss the synchronization with certain and uncerta...

in this study, a new approach for control (treatment) of aids based on patient entry drug. one of the main problems related to aids, is lack of control, lack of identification and early treatment of this disease. today physicians more than anything, control the disease relying on their experience and knowledge and time-consuming and complex experiments, nevertheless, human errors are inevitable...

In some statistical process monitoring applications, quality of a process or product is described by more than one ordinal factors called ordinal multivariate process. To show the relationship between these factors, an ordinal contingency table is used and modeled with ordinal log-linear model. In this paper, a new control charts based on ordinal-normal statistic is developed to monitor the ord...

The wafer defects influence the yield of a wafer. The integrated circuits (IC) manufacturers usually use a Poisson distribution based c-chart to monitor the lot-to-lot wafer defects. As the wafer size increases, defects on wafer tend to cluster. When the c-chart is used, the clustered defects frequently cause erroneous results. The main objective of this study is to develop a hierarchical adapt...

• We present a new adaptive sampling method for statistical quality control. In this method, called LSI (Laplace sampling intervals), we use the probability distribution function of the Laplace standard distribution to obtain the sampling instants, depending on a k parameter that allows control of sampling costs. Several algebraic expressions concerning the statistical properties of the LSI met...